Reflectors and Targets

When tracker measurements are taken, the planar and radial offsets are stored with the measured points. Since laser trackers aren’t aware of the target or tooling being used, you need to keep the interface informed of which tooling you’re using, so that the proper offsets can be assigned to measurements, and so those offsets can be accounted for when analyzing to surfaces or fitting geometry.

Access to the list of defined targets and target management can be found here:

 

The Reflectors and Targets Database is divided into 3 separate sections:

 

In order to define a target and use it for measurement there is a two step process that must be followed:

 

First, the measurement properties of a target must be defined. These properties define the ADM offset and include other specialized measurement settings. Often times these need to be defined in the instrument's native software (such as Tracker Pilot) prior to being available for use by the instrument.

ADM offset correction is applied when the difference in beam travel length when comparing the red laser to the ADM signal (due to refraction/dispersion) is significant. This is usually the case when the reflector has a clear windowed housing to protect the mirror, or when the reflective surface of the SMR is not the front face (the beam must travel through some material other than air before being reflected). ADM offsets apply a small correction to the measured distance value to account for the different behavior of ADM-wavelength signals.

To define a User Definition you can either select and copy and existing manufacturer reflector definition and then edit it as needed. Or you can directly measure the ADM offset using an IFM measurement of the target in the trackers nest (this is only possible if your tracker both as a nest and can perform an IFM only measurement).

When working with T-Mac you can double click on the target definition to access the offset frame definition.

 

The IFM (Home Distance) Check offers an option to verify the ADM offset of the selected reflector in the Home position. This can only be used with IFM only trackers that have a home position.

The ADM Offset Check offers an option to verify the ADM offset based upon IFM distance measurements. This also required a system with separate IFM and ADM measurement options.

 

Second, build a target for measurement. This process includes a custom target name and the probe offsets that are to be saved when a measurement is taken these are defined in the bottom half of the window.

 

This table has a number of columns that describe the attributes of the target:

 

Understanding the target Definition:

As an example in the picture below is a pin nest definition:

Here the target was built from the "RRR 1.5in" manufacturer definition, so this is included in the default name. This is also shown in the Reflector/Probe column which acts as a drop-down list allowing you to change the selected target definition if needed. The default probe radius is then shown followed by the tooling added to it. In this case an extra .25" planar offset is added as well as a 0.125" lateral offset override. When you measure with this target definition you will get a point that has a 1" total planar offset (0.75+0.25) and records a 0.126" lateral offset which is equal to the radius of the pin.

The easiest way to build targets is to use the buttons at the side of the dialog.

 

New Targets can be either be added directly by using the Add: Copy Selected Target button or the Add: From Selected Reflector option offers a wizard for building multiple targets at the same time:

The Add Targets dialog can be broke into 3 sections.

The top is a simple add button. The middle section offers the ability to build pin, plane or edge nests. And finally, the last section offers options for building probes of different diameters.

Select one or more of the check boxes.... All the checked entries will be built for you at the same time when you press the OK button to exit the dialog.