Enable an offset frame definition for a single or multi-face 6D probe. The will edit the offset frame saved directly with the probe, not any of the individual measurement profiles. This command will trigger a measurement of a raw frame and apply the current offset of the selected offset frame to the target definition.
0 |
Collection Instrument ID |
Instrument ID |
Instrument to be edited |
1 |
String |
Probe Name |
Name of the probe definition to edit |
2 |
Integer |
Face ID |
Face ID to edit |
3 |
String |
Measurement Profile Name |
Name of the Measurement Profile to use for the offset frame measurement. |
4 |
Double |
Timeout in Seconds |
Maximum duration to wait for a measurement to be taken |
5 |
Collection Object Name |
Offset Frame |
Selected offset frame which defines the transform to apply with respect to the raw measured frame. |
None.
SUCCESS |
The offset frame was applied |
FAILURE |
The instrument or target could not be found. |
None.